AFM-induced amine deprotection: Triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic …

…, I Suez, SA Backer, JMJ Fréchet

文献索引：Fresco, Zachary M.; Suez, Itai; Backer, Scott A.; Frechet, Jean M. J. Journal of the American Chemical Society, 2004 , vol. 126, # 27 p. 8374 - 8375

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被引用次数: 40

摘要

An α, α-dimethyl-3, 5-dimethoxybenzyloxycarbonyl (DDZ)-protected amine monolayer can be selectively deprotected by the application of a voltage bias from a conducting AFM tip to afford localized nanoscale patterns that can be visualized by self-assembly of dendritic molecular objects with terminal carboxylic acid groups and different aspect ratios.