methyl(pentyl)amine

Names

[ Name ]:
methyl(pentyl)amine

[Synonym ]:
methylpentylamine
MFCD00041354
N-Methyl-1-pentanamine
N-methyl-N-pentan-1-amine
methyl(pentyl)amine
Pentylamine,N-methyl
N-n-pentyl-N-methylamine
N-methylpentylamine
methyl-n-pentylamine
N-Methylpentan-1-amine
N-methyl-N-pentylamine
1-Pentanamine, N-methyl-
N-Pentylmethylamine
1-Pentanamine,N-methyl
EINECS 246-966-9

Chemical & Physical Properties

[ Density]:
0.7±0.1 g/cm3

[ Boiling Point ]:
116.1±3.0 °C at 760 mmHg

[ Molecular Formula ]:
C₆H₁₅N

[ Molecular Weight ]:
101.190

[ Flash Point ]:
11.0±8.8 °C

[ Exact Mass ]:
101.120445

[ PSA ]:
12.03000

[ LogP ]:
1.70

[ Vapour Pressure ]:
18.5±0.2 mmHg at 25°C

[ Index of Refraction ]:
1.405

MSDS

Click to get detail MSDS

Safety Information

[ Symbol ]:

GHS02, GHS05, GHS06

[ Signal Word ]:
Danger

[ Hazard Statements ]:
H225-H301-H314

[ Precautionary Statements ]:
P210-P280-P305 + P351 + P338-P310

[ Personal Protective Equipment ]:
Faceshields;full-face respirator (US);Gloves;Goggles;multi-purpose combination respirator cartridge (US);type ABEK (EN14387) respirator filter

[ Hazard Codes ]:
F:Flammable;

[ Risk Phrases ]:
R11;R34

[ Safety Phrases ]:
S26-S36/37/39-S45-S33-S29-S16-S9

[ RIDADR ]:
UN 2924 3/PG 2

[ WGK Germany ]:
3

[ Packaging Group ]:
III

[ Hazard Class ]:
3

[ HS Code ]:
2921199090

Synthetic Route

Click to get detail synthetic route

Precursor & DownStream

Precursor

DownStream

Customs

[ HS Code ]: 2921199090

[ Summary ]:
2921199090 other acyclic monoamines and their derivatives; salts thereof VAT:17.0% Tax rebate rate:9.0% Supervision conditions:none MFN tariff:6.5% General tariff:30.0%

Articles

Impurity profiling of ibandronate sodium by HPLC-CAD.

J. Pharm. Biomed. Anal. 114 , 254-64, (2015)

The modern bisphosphonate drug ibandronate sodium, a challenging candidate for impurity profiling, was analyzed using high performance liquid chromatography (HPLC) combined with corona charged aerosol...

Interactions of alkylamines with the silicon (001) surface. Cao X and Hamers RJ.

J. Vac. Sci. Technol. B 20(4) , 1614-19, (2002)